Please activate JavaScript!
Please install Adobe Flash Player, click here for download
ePaper created 2015-05-14, 11:05:01 | version 1.38.0
I industry news _ MIS _Israeli manufacturer MIS Implants Technolo- gies has announced that its products have achieved favourable results in an extensive qualitative and quantitative elemental analysis using scanning elec- tron microscopy. The study was conducted on behalf of the Quality and Research Committee of the Euro- pean Association of Dental Implantologists. It in- cluded65systemsofsterile-packagedimplantsfrom 37 manufacturers and ten countries. According to the intermediate study report, the C1 implant and the SEVEN implant manufactured by MIS achieved noteworthy results. Although the SEVEN implant exhibited blasting material on up to 7percentofthesurfaceinearlierstudiesbythecom- mittee in 2011 and 2012, the researchers did not find even isolated spots with residue on the two MIS im- planttypesofGrade23titaniuminthecurrentstudy. MIS Materials Discipline Manager Dr Tal Reiner explained the surface treatment processes applied byMISthatledtotheresults:“Wemonitorthesurface roughness, uniformity and purity of our implants on a daily basis, taking samples from selected batches, and using our own in-house scanning electron mi- croscope.Becausetheanalysisisdoneinourownlabs, on-site,there’snoholdingupproductionforrepairs.” “MISadherestostrictprocedures,addinganysteps necessarytoensurethelowestpercentageofcontam- inants, including blasting residue or remnants from variousstagesofproduction,”Reineradded.“Because the scanning electron microscope analysis is done on samples only, a trained technician also does a 100 per centvisualinspectiononeachandeveryimplant.Any flawed implants are unconditionally rejected.” The intermediate report, titled “Surface analysis of sterile-packaged implants”, was published in the 01/2015 issue of the European Journal for Dental Implantologists. Thisisthesecondtimewithinthepast12months that a study has verified MIS’s implant quality claims.Thefirststudy,titled“Identificationcardand codification of the chemical and morphological characteristics of 62 dental implant surfaces. Part 3: Sand-blasted/acid-etched (SLA type) and related surfaces (Group 2A, main subtractive process”, was published in the June 2014 issue of the POSEIDO journal. According to the study, which included 18 differentimplants,MIS’sSEVENimplantwasamong the three implants that showed no pollution and no chemical modification of the surface._ Left: Residue-free surface of a MIS SEVEN implant (500x magnification). Right: MIS SEVEN implant surface with micro-/nano-structure (2,500x magnification). (Images courtesy of Dr Dirk Duddeck and Dr Jörg Neugebauer, University of Cologne) MIS implants stand out in comparative implant surface study 50 I CAD/CAM 2_2015 MIS Implants Technologies P.O.Box 7 Bar Lev Industrial Park 20156 Israel www.mis-implants.com CAD/CAM_contact